Plenary Speakers
(in alphabetical order)
Chi Fai Benny Cheung State Key Laboratory of Ultra-precision Machining Technology Ir Professor Benny C.F. Cheung is the Chair Professor of Ultra-precision Machining and Metrology at the Department of Industrial and Systems Engineering, Director of State Key Laboratory of Ultra-precision Machining Technology, The Hong Kong Polytechnic University. He is also a Fellow of the International Academy for Production Engineering (CIRP Fellow), the International Academy for Engineering and Technology (AET Fellow), and a College of Fellow of the American Society for Precision Engineering (ASPE College of Fellow). His main research interests include ultra-precision machining, precision metrology and smart precision manufacturing. Up to present, he has authored and co-authored more than 300 SCI/SSCI indexed refereed journal papers. He received many research prizes and awards including 2008 ASAIHL-Scopus Young Scientist Awards – First Runner Up Prize in the category of “Engineering and Technology”, Joseph Whitworth Prize 2010 and A M Strickland Prize 2017 by The Institution of Mechanical Engineers, UK, Bank of China Hong Kong Science and Technology Innovation Prize 2023. – Advanced Manufacturing, etc. | |
| Non-destructive Smart Testing and Inspection Technology for Semiconductor SiC Wafers | |
Abstract: Semiconductor wafer manufacturing is a highly time-sensitive precise industry that requires strict process control to meet stringent dimensional tolerances. The surface topography of wafers exhibits significant multi-scale characteristics. At the macroscopic scale, it manifests as deviations in overall flatness. At the mesoscale, it manifests as fluctuations in local waviness, and at the microscale, it manifests as surface roughness as well as local defects such as scratches and pits. These multi-scale morphological characteristics influence key processes. In this presentation, a non-destructive smart testing and inspection technology for semiconductor SiC wafers is presented for multi-scale surface measurement and defect characterization in manufacturing of SiC wafers. Hence, a multi-mode non-destructive smart detection system is established based on variable-scale shear interferometry, super-resolution machine vision microscopy, intelligent extraction and quantitative characterization of global defects and sub-surface defects. The system offers high lateral resolution and sufficient sensitivity to measure nanoscale topography and surface roughness by acquiring a single snapshot of the wavefront phase image. It innovatively integrates microscopy and beam expansion into a single optical path. Through a built-in mirror switching mechanism, it can flexibly switch between high-precision microscopy and a wide field of view, achieving a balance between compactness and versatility. | |
Ömer Sahin Ganiyusufoglu Qingdao International Academician Park Prof. Ganiyusufoglu is member of German National Academy of Science and Engineering (acatech), advisory professor of Tongji University, Honorary Professor of Nanjing University of Aeronautics and Astronautics, Yantai University and Zhejiang University for Science and Technology. | |
| ACSM - Atomic and Close-to-atomic Scale Manufacturing – A Chance for Future and a Challenge – | |
Abstract: The traditional manufacturing technologies of our time have reached their limits. Electronics are advancing at an ever-increasing pace. The growing miniaturisation in electronics and the advent of quantum computing are opening up new possibilities. | |
Wanlin Guo State Key Lab of Mechanical Structural Mechanics and Control Wanlin Guo, an academician of the Chinese Academy of Sciences, a professor at Nanjing University of Aeronautics and Astronautics, and the Dean of the International Institute for Frontier Science. Professor Guo Wanlin has long been engaged in research on digital science and intelligent technology for aerospace, hydrovoltaic science and technology, and physical mechanics. His current research focuses on hydrovoltaic energy, ecology and intelligence; quantum biophysical mechanics; intelligent nanomaterials and devices; and structural strength, durability and reliability. In 2012 and 2024, he twice received the Second Prize of the National Natural Science Award of China as the leading recipient. In 2013, he received the Xu Zhilun Mechanics Prize. In 2019, he was awarded the Ho Leung Ho Lee Foundation Prize for Scientific and Technological Progress and the Eric Reissner Award in International Mechanics. In 2020, he was honored with the title of National Advanced Worker. | |
| From Artificial Intelligence (AI) to Hydrovoltaic Intelligence (HI) | |
Abstract: This report starts from the wisdom of living beings in acquiring energy for survival, extends to the understanding of natural intelligence and brain functions, and then to the frontier progress and challenges of artificial intelligence. Furthermore, based on the relationship between water and life, as well as water and energy, it proposes the concept of hydrovoltaic intelligence: exploring how the synergy of 'intelligence' and 'energy' can lead the future development of science, technology, and human civilization. | |
Enrico Savio Department of Industrial Engineering - Precision Manufacturing Enrico Savio is a Professor of Digital Manufacturing at the University of Padova, Italy, with a research focus on Manufacturing Metrology. Current research interests include on-machine and in-process metrology, metrology of freeform surfaces and complex parts, digital-metrological twins, and economics of measurements in industry. He is a Fellow of CIRP, in which he served as Chairman of the Scientific Technical Committee “Surfaces”; was President of euspen; in 2003, he was awarded the CIRP F.W. Taylor Medal. | |
| Integrated metrology in advanced manufacturing: connecting digital twins and applications | |
Abstract: This keynote addresses the integration of digital twins (DTs) and metrology in advanced manufacturing applications. DTs enable real-time synchronization between physical systems and their virtual representations, supporting enhanced monitoring, predictive modeling, and process control. The continuous acquisition of measurement data enables dynamic model updates, improving process optimization, particularly in small-batch and high-variability production. | |
Suet Sandy To Department of Industrial and Systems Engineering TO Suet is a Professor in the Department of Industrial and Systems Engineering of the PolyU, an Associate Director of the State Key Laboratory of Ultra-precision Machining Technology and Advanced Optics Manufacturing Center, and Director of PCB and Functional Materials Characterization Laboratory. She is a Committee Member of the Asian Society for Precision Engineering and Nanotechnology (ASPEN), Member of the Chinese Mechanical Engineering Society (CMES), Member of The International Academy for Production Engineering (CIRP) and Fellow of Hong Kong Institution of Engineers (HKIE). She also serves as the editorial board member of several international journals. Her main research directions include research on ultra-precision machining of micro-nano structural functional surfaces; research on multi-field-assisted ultra-precision machining of difficult-to-cut materials; and smart manufacturing of ultra-precision machining technology. Prof. To has undertaken more than 20 key research projects as principal investigator. Her research outcomes are well-recognized. She has published seven research books and more than 350 international journal papers, was ranked as the World’s Top 2% most-cited scientists 2025 by Stanford University. Her research outcomes were granted the Natural Science Award and Scientific and Technological Progress Award by the Higher Education Outstanding Scientific Research Output Awards by the Ministry of Education of the PRC, as well as three times, as a supervising teacher, received the Hiwin Doctoral Dissertation Award from the Chinese Mechanical Engineering Society. Prof. To has been granted 26 patents and was invited to be the keynote or invited speaker at several international conferences. | |
| Multi-energy Field Assisted Ultra-precision Machining of Difficult-to-Cut Materials | |
Abstract: Ultra-precision machining technology based on single-point diamond turning (SPDT) and ultra-precision freeform machining have become an indispensable tool for the design and the manufacture of high- technology and high-precision lenses. The process is capable of producing components with micrometer to sub-micrometer form accuracy and surface roughness in the nanometer range. With the fast growing development of machining technology, ultra-precision machining technology is used not only for manufacturing symmetrical spherical and aspheric workpieces, but also to produce some very complex and non-symmetrical microstructures. | |